LASER THERMAL ANALYSIS, INC

Laser Thermal Analysis is a precision instrumentation company born from academic research at the University of Virginia's ExSiTE Lab, driven by the mission to make thermal property measurements available to researchers, engineers, and product developers. The company has developed a suite of thermal analysis tools — including Steady State Thermoreflectance in Fiber Optics (SSTR-F), Thermo-Optical Plane Source (TOPS), and Frequency And Steady-state ThermoReflectance (FASTR) — that provide accurate, high-throughput, and user-friendly measurement of thermal conductivity, resistance, and volumetric heat capacity across a wide range of material types and length scales. SSTR-F is a non-contact, non-destructive thermal property measurement system enabling turnkey, high-throughput measurements, spanning thin films to bulk wafers and composites. Laser Thermal works with industrial companies, academic institutions, and government partners including NIST as part of the CHIPS for America initiative, where its SSTR-F tool addresses vital challenges in semiconductor metrology. The company also offers rapid-turnaround thermal metrology testing services for material interfaces, thin films, bulk materials, liquids, gels, foams, and pastes.