埃芯半导体 (Angstrom-e)

Shenzhen Angstrom Excellence Technology (埃芯半导体科技有限公司) is a high-tech semiconductor equipment company specializing in front-end wafer metrology and inspection systems for semiconductor manufacturing. Its product portfolio spans optical thin-film measurement, optical critical dimension (CD) measurement, optical diffraction overlay measurement, X-ray thin-film measurement, X-ray diffraction, X-ray photoelectron spectroscopy (XPS), and scientific instruments — marketed under the Åthena Xcellence and High Yield product lines. The company supports advanced logic, DRAM, and 3D NAND process nodes, and is positioned as a domestic Chinese alternative to international metrology leaders.